关于“集成电路漫谈:从技术趋势到职业规划”学术报告会的通知
发布人:信息系  发布时间:2017-12-07   浏览次数:10

报告人:温晓青

题 目:集成电路漫谈:从技术趋势到职业规划

时间:201738日(周三)19:00-21:00

地点:敬亭学堂120


报告人简介:

温晓青教授,现任日本九州工业大学博士生导师以及IEEE Fellow,1986年获中国清华大学学士学位,1990年获日本广岛大学硕士学位,1993年获日本大阪大学博士学位。1993年至1997年,他担任日本秋田大学的助理教授。199510月至19963月,在美国威斯康辛大学麦迪逊分校做访问研究员。于1998年加入美国SynTest技术公司,并且并担任首席技术官一直到2003年。2004年加入日本九州工业大学成为集成系统研究中心的教授和主任。

研究方向包括芯片可测性设计、测试生成及故障诊断等。已发表学术论文170 余篇,编著学术专著: “VLSI测试原理和架构:可测性设计,以及低功耗器件的功率感知测试和测试策略。拥有关于VLSI41项美国专利及14项日本专利,并担任IEEE TCADIEEE T-VLSI 等学术杂志的编委以及众多国际会议的程序委员。


Xiaoqing Wen received a Bachelor degree from Tsinghua University, China, in 1986, a Master degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. From 1993 to 1997, he was an Assistant Professor at Akita University, Japan. He was also a Visiting Researcher at University of Wisconsin - Madison, USA, from October 1995 to March 1996. He joined SynTest Technologies, Inc., USA, in 1998, and served as its Chief Technology Officer until 2003. In 2004 he joined Kyushu Institute of Technology, Japan, where he is currently a Professor and Director of Dependable Integrated Systems Research Center. His research interests include VLSI testing, diagnosis, and testable designs. He has co-authored and co-edited two books: VLSI Test Principles and Architectures: Design for Testability, and Power-Aware Testing and Test Strategies for Low Power Devices. He holds 38 U.S. Patents and 14 Japan Patents on VLSI testing. He received IEICE-ISS Best Paper Award in 2008. He is a fellow of IEEE and a trustee of REAJ.



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